Press Release Hub logo
  • Submit a Release
  • Home
  • All
  • ESG
  • Health
  • Technology
  • Finance
  • Contributors

Spirox and Southport Launch Industry-first Non-Destructive SiC Defect Inspection System: Saving Significant Costs and Increasing Output

Contributed by: PR Newswire

Images

PR Newswire associated0

Tags

Spirox-SiC-Launch

More Like This

PR Newswire associated0

Spirox Launches High-Speed TGV Crack Inspection System to Support High-Volume Glass Substrate Inspection

PR Newswire associated0

Tomocube Launches HT-T1 Desktop for 3D Glass Substrate Defect Analysis in Advanced Packaging

PR Newswire associated0

E&R: Leading SiC Process Integration Advance Solutions for Process Yield Enhancement

ONYX 3200

Rigaku Launches ONYX 3200, a Metrology Instrument for Semiconductor Manufacturing

From left: Award recipients Kazuhiko Omote, General Manager, X-ray Research Laboratory; and Raita Hirose, Imaging Group, Advanced Analytical Technology Research Department, X-ray Laboratory (Photo: Business Wire)

Rigaku Wins Diana Nyyssonen Memorial Best Paper Award with Method for Inspecting and Measuring Defects in 3D Flash Memory

XTRAIA XD-3300

Rigaku Launches XTRAIA XD-3300 Mass Production for Semiconductor Market

PR Newswire associated0

DB HiTek Completes Reliability Qualification for 8-Inch 1,200 V SiC MOSFET Process

Two-layer sample processed by Shin-Etsu dual damascene method (Cross-section view) (Photo: Business Wire)

Shin-Etsu Chemical: Developing Equipment to Manufacture Semiconductor Package Substrates for the Back End Process and Pursuing a New Manufacturing Method

Pages

  • Home
  • All
  • ESG
  • Health
  • Technology
  • Finance
  • Contributors

Press Release Hub

  • Our Services
  • Submit a Release

Websites

  • PA Media Group
  • PA Mediapoint
  • Distribution Packages

© PA Media Group. 2026

Terms of Use

Privacy Policy

Contact Us